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Seminar | X-Ray Science

CITIUS: A 17,400 Frames/s X-ray Imaging Detector with a Linear Response of Up to 945 Mcps/pixel

XSD/DET Special Presentation

Abstract: We report our recent progress in the CITIUS (Charge Integration Type Imaging Unit with high-Speed extended-dynamic-range) detector. It has been developed to overcome the count rate limitation of the current state-of-the-art photon counting detector by introducing novel integrating-type pixels with a size of 72.6 micrometers and a high frame rate of 17.4 kfps. Recently we succeeded in experimentally demonstrating its detecting capability of 945 Mcps/pixel (18 Tcps/cm2) at 10 keV while keeping its single photon sensitivity.

In this talk, we report our development status including the performance evaluation and the on-the-fly data processing with FPGAs. A feasibility study of Bragg CDI was carried out at ESRF last year. At SPring-8, applications of these detector systems to XPCS, ptychography, SAXS & WAXS, X-ray beam monitors by using spectro-imaging capability, and fluorescence yield XAFS by using large-area high-count-rate energy resolving detection are in progress. The status of these applications is also reported.

Table I Specifications of CITIUS variant for Synchrotron radiation experiments

Parameters 

Value 

Sensor 

Thickness 

650 µm 

Pixel Size 

72.6 µm 

Pixel Number 

0.28 Mpixel/sensor 

Noise 

0.027 phs. @ 8 keV (60 e-) 

Peak Signal 

1,800 phs. @ 12 keV 

Frame Rate 

17.4 kHz 

Sat. Count Rate @12 keV 

30 or 600 Mcps (*) 

Largest System 

Pixel Number 

20.2 Mpixel 

Image Area 

325 x 363 mm 

(*) 30 Mcps with standard operation. 600 Mcps in an extended mode