Abstract: The plastic deformation mechanisms of ultrafine grained gold thin films (average grain size of 150 nm) irradiated with 2.8 MeV Au+ ions at three different levels (0.1, 1 and 5 dpa) have been studied using quantitative in-situ transmission electron microscopy (TEM) nanomechanical testing. This technique allows for the simultaneous observation and comparison of the active deformation mechanisms, measurement of mechanical properties and true activation volume. Some of the observed deformation mechanisms include dislocation nucleation at grain boundaries (GB), dislocation pinning/de-pinning at irradiation induced defects, and stress-induced GB migration.

During the early stages of deformation, dislocation nucleation and GB migration occur simultaneously. However, the dense populations of irradiation-induced defects prevent transgranular dislocation motion. As the deformation levels increase, GB migration leads to defect-free zones which then provide avenues for unimpeded dislocation glide. The true activation volume increases from ~10b3 in unirradiated specimens, to ~22b3 in irradiated specimens at 1dpa, for flow stresses ranging from 400 to 550 MPa.