Abstract: To date, many emerging techniques have been combined with scanning tunneling microscopy (STM) to discover and explore new phenomena. In addition to an overview of the development of synchrotron X-ray STM (SXSTM), this talk demonstrates a novel application of SXSTM that combines synchrotron X-ray and STM to study magnetic, electronic, and structural properties of materials interfaces. A nanofabricated tip is used to capture X-ray magnetic circular dichroism and near-edge X-ray absorption fine structure signals, which explain charge transfer and magnetic properties of oxide materials interfaces with chemical and elemental sensitivities. Using X-ray absorption spectroscopy and spectroscopic imaging, the effect of charge transfer at the interfaces formed by transition metals of cobalt and nickel in nanoscale clusters and islands on a Cu(111) surface has been explored. Finally, X-ray standing waves formed by the interference of the incident and diffracted X-ray beams are used to characterize the structural properties of a cobalt thin film grown on a Au(111) surface. These results open novel research directions where material characterizations will be able to perform simultaneous chemical, structural, and magnetic contrast potentially down to atomic scale.