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Joe Strzalka

Physicist

Joe Strzalka supports the Grazing-Incidence X-ray Scattering (GIXS) instrument at beamline 8-ID-E of the APS. His research interests include functional organic thin films, nanopatterning and proteins at interfaces.

Biography

Education

  • Physical Chemistry, Ph.D., University of Pennsylvania, 2000
  • Physics, M.S., University of Pennsylvania, 2000
  • Electrical Engineering, B.S.E., Princeton University, 1991

Selected Publications