Dr. Xianghui Xiao is a physicist in the X-Ray Science Division at Argonne National Laboratory. He is the principle investigator at the dedicated tomography beamline 2-BM. He holds a Ph.D. in Physics from the Institute of High-Energy Physics, Chinese Academy of Sciences (2002) and a bachelor’s degree in Metallurgy from Chongqing University (1993). He joined Argonne in 2009 as a beamline scientist.

Dr. Xiao’s research interests are on developing X-ray imaging techniques and image analysis tools that are suitable in dynamic phenomenon studies.