![Scanning tunneling microscopy topography of a rippled MoS2 single layer as a result of strain relaxation (bottom). The corresponding dI/dV map at the valence band edge (middle), and the strain map (top) are overlaid.](https://sandbox4-www.anl.gov/sites/www/files/styles/article_teaser_16x9/public/2019-11/Ripple_Art1.jpg?h=8abcec71&itok=omJcB_Qg)
thin films
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