Synthesis

• Colloidal chemistry and self-assembly techniques.
• Physical vapor deposition (Lesker CMS 18 and PVD 250).

Theory

• Would you like Theory with that? Joint experimental-theory proposals are possible and encouraged; visit the Theory & Modeling group’s webpage for more information about their capabilities. 

Characterization

• Variable-temperature (VT) scanning tunneling microscope with atomic force microscopy capabilities (Omicron VT-AFM/STM). It operates in an ultrahigh vacuum environment with a base pressure of < 1E-10 mbar and temperature range of 55-400 K. Atomic resolution is routinely obtained at room temperature and below. The AFM capabilities support a range of scanning modes. The analysis chamber also houses a LEED/Auger with an attached preparation chamber for sample cleaning and deposition (e.g., sputter cleaning, direct current heating, e-beam heating stage, and metal deposition).
• Low-temperature ultrahigh vacuum scanning tunneling microscope (4 K base with temperature variability) with 6 T external magnetic field applied normal to the sample surface. Intended for VT high-impact research requiring an external magnetic field (Omicron Cryo SFM).
• Low-temperature scanning tunneling microscope (LT-STM, Createc).
• Scanning probe microscope Veeco Multi Mode 8 [contact or tapping mode, fluid imaging, low-current scanning tunneling microscopy, magnetic force microscopy, variable temperature imaging (-30-250°C), and peak force tapping mode and peak force quantitative nanomechanical mapping].
• Laser scanning interferometric microscope.
• Luminescence spectrometer (Perkin-Elmer LS55).
• Magnetic and physical properties characterization suite (Keithley 4200-SCS/F Semiconductor Parameter Analyzer, Quantum Design PPMS-9 and MPMSXL).
• Optical microscope (Zeiss Axio Imager Z1 M Upright).
• Rheometer (Anton Paar Physica MCR 301). This can be accessed alone or as part of the joint CNM/APS rheometry small-angle X-ray scattering X-ray photon correlation spectroscopy system (Rheo-SAXS-XPCS) housed at Sector 8-ID-I of the APS.
• Thermal analysis [differential scanning calorimetry (Mettler Toledo 823) and thermogravimetric analysis (Mettler Toledo 851)].
• Ultraviolet-visible-near-infrared spectrometer (Perkin-Elmer Lamda 950).
• X-ray diffractometer (Bruker D8 Discover, point detector, VÅNTEC-1 linear detector; Bragg-Brentano powder, grazing incidence, high-resolution four-circle, reciprocal space mapping, reflectivity, and rocking curves).
• X-ray diffractometer (Bruker D8 Discover, IµS tube, Eiger2 R 500K area detector; high-resolution four-circle, SAXS, GI-SAXS, grazing incidence, 2D powder, reciprocal space mapping, reflectivity, and rocking curves).
• X-ray diffractometer (Bruker D2 Phaser, LYNXEYE detector, 2-theta/theta).

Synchrotron X-ray Scanning Tunneling Microscopy (SX-STM)

Synchrotron X-ray scanning tunneling microscopy (SX-STM) is a new imaging technique that uniquely combines the best of two worlds: the exceptional chemical, magnetic, and structural sensitivity of X-rays combined with the unparalleled ability of scanning probe microscopy to resolve and manipulate surfaces down to single atoms. In collaboration with the APS X-ray Science division we have developed XTIP, the world’s first dedicated synchrotron beamline for SX-STM, located at Sector 4 of the APS. Experiments there focus on the study of chemical and magnetic properties of nanoscale materials using SX-STM at photon energies between 500 and 2500 eV.